Strain gauge, and system for spatially locating such gauges
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United States of America Patent
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Dec 1, 2015
Grant Date -
Jun 14, 2012
app pub date -
Aug 12, 2010
filing date -
Aug 17, 2009
priority date (Note) -
In Force
status (Latency Note)
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Abstract
A strain gauge includes a substrate (2) for mounting an element (3) to be reversibly lengthened by a force applied while displaying a variation in the resistance thereof, the element (3) lengthening itself along an axis for measurement by the gauge. The gauge includes at least one contrast target (5, 6) capable of reflecting an incident light beam, the at least one contrast target (5, 6) being placed on the gauge in a predetermined position that makes it possible to predetermine the center of the axis (4), for measurement by the strain gauge (1), by detecting the position of the at least one contrast target (5, 6).
First Claim
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International Classification(s)
- G01M:TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR S....
- G01L:MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL ....
- G01N:INVESTIGATING OR ANALYSING MATERIALS BY DETERMININ....
- G01S:RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMI....
- G01B:MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIME....
- G06K:RECOGNITION OF DATA; PRESENTATION OF DATA; RECORD ....
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