Mechanical testing instruments including onboard data
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United States of America Patent
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Nov 24, 2015
Grant Date -
Dec 12, 2013
app pub date -
Nov 23, 2011
filing date -
Nov 24, 2010
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Abstract
A method of calibrating a mechanical instrument assembly includes reading a memory device coupled with a mechanical testing instrument, the mechanical testing instrument having one or more mechanical characteristics with values unique to the mechanical testing instrument, and reading includes reading of one or more calibration values based on the one or more mechanical characteristic values. The method further includes calibrating the mechanical instrument assembly according to the one or more calibration values. The mechanical testing instrument is coupled with the mechanical instrument assembly.
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