System and method for compensating for second order diffraction in spectrometer measurements
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United States of America Patent
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Nov 17, 2015
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app pub date -
Aug 11, 2014
filing date -
Aug 11, 2014
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Abstract
The present invention concerns a system and method for identifying and implementing a correction to spectrometer measurements in order to compensate for errors in the measurement values due to second order diffracted light. The present invention in one configuration, measures light reflectance percentages across the same wavelength range for at least one calibration target. From these measurements the portion of the reflectance values resulting from second order diffracted light is identified and corrected for, thereby generating a compensated measurement of the reflectance values of a sample. These compensated values are then provided to a user.
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