Instrument and method of measuring the concentration of a target element in a multi-layer thin coating
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United States of America Patent
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Nov 10, 2015
Grant Date -
May 22, 2014
app pub date -
Nov 14, 2013
filing date -
Nov 16, 2012
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Abstract
An instrument and a method of detecting a target element in a multi-layer thin coating. Lα, Lβ and Lγ x-rays are caused to be emitted from the target element (preferably lead paint) with excitation radiation. Upon detecting the emitted x-rays, an areal concentration of the target element is calculated using Lα and Lβ intensities once, and then using the Lβ and Lγ intensities once, by reference to a single layer model; By combining the two concentrations calculated using single layer model, a more accurate concentration can be calculated for the target element in the multi-layered surface coating.
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