Probe indicating intermaterial boundaries
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United States of America Patent
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Nov 10, 2015
Grant Date -
Feb 28, 2013
app pub date -
Feb 25, 2011
filing date -
Mar 1, 2010
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Abstract
The present invention describes a method, apparatus and computer program for detecting the locations of boundaries between different materials in a desired measurement volume. The apparatus uses at least one measuring probe, the electrodes of which are characterized in that they together form an assembly that differs from a straight line. In addition, a volume at a further distance from the assembly can also be observed by the assembly, so that measurements can be conducted remotely and, on the other hand, the apparatus stays unbroken in diverse measurement situations. By using the EIT-measurement and applying for example a so-called 1D-σ-method or methods of machine learning, electrical conductivity distributions in the measured volume are detected. As a result, the locations of the possible boundaries between different materials or for example thicknesses of different material layers are detected.
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