I-V characteristic measuring apparatus and I-V characteristic measuring method for solar cell, and recording medium recorded with program for I-V characteristic measuring apparatus

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United States of America Patent

PATENT NO 9176182
APP PUB NO 20140354323A1
SERIAL NO

14141344

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Abstract

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To provide an I-V characteristic measuring apparatus that can, even though a solar simulator of a flash light type is used, accurately measure a true I-V characteristic of a solar cell that exhibits a different I-V characteristic depending on a sweep direction when a sweep time of applied voltage is short, an internal division ratio calculation part that, at each voltage value, calculates an internal division ratio at which a current value of a dark state stationary I-V characteristic internally divides a gap between a current value of a dark state forward I-V characteristic and a current value of a dark state reverse I-V characteristic; and a light state stationary I-V characteristic estimation and calculation part that, on the basis of the internal division ratio, a light state forward I-V characteristic, and a light state reverse I-V characteristic, estimates and calculates a light state stationary I-V characteristic are provided.

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Patent Owner(s)

Patent OwnerAddress
NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY3-1 KASUMIGASEKI 1-CHOME CHIYODA-KU TOKYO 1008921 ?1008921
KYOSHIN ELECTRIC CO LTD18 GOSYONOUCHI-NISHIMACHI SHICHIJYO SHIMOGYO-KU KYOTO-SHI KYOTO 600-8865

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hishikawa, Yoshihiro Tsukuba, JP 4 17
Kamatani, Kohei Takatsuki, JP 9 5
Kondo, Hajime Kyoto, JP 39 406
Shimono, Akio Kyoto, JP 13 44
Shimura, Haruya Tsukuba, JP 1 5

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