Estimation of defocused reflectance maps for the robust determination of “shape from focus” in microscopic images

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United States of America Patent

PATENT NO 9161014
SERIAL NO

13810831

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Abstract

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Method for compensating illumination deficiencies in microscopic “shape from focus (SFF)”, wherein firstly the reflectance of the scene is estimated by way of a projector-camera system and then microscopic “shape from focus (SFF)” is applied to a stack of reflectance maps rather than to the original image data.

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Patent Owner(s)

Patent OwnerAddress
TECHNISCHE UNIVERSITÄT GRAZRECHBAUERSTRASSE 12 GRAZ 8010
ALICONA IMAGING GMBH8074 RAABA BEI GRAZ

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Bischof, Horst Eggersdorf B. Graz, AT 4 21
Lenz, Martin Graz, AT 49 580
Prantl, Manfred Graz, AT 2 9
Ruther, Matthias Graz, AT 1 5
Scherer, Stefan Graz, AT 111 489

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