Machine tool—based, optical coordinate measuring machine calibration device
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United States of America Patent
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Oct 13, 2015
Grant Date -
Jul 26, 2012
app pub date -
Feb 27, 2012
filing date -
May 3, 2010
priority date (Note) -
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status (Latency Note)
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Abstract
A calibration artifact for an inspection system is provided. The calibration artifact comprises a base adapted for placement within a holding fixture of an inspection system during calibration, a sphere operatively connected to the base, and a light source operatively connected to the base. The base, the sphere, and the light source are removable from the inspection system after calibration.
First Claim
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International Classification(s)
- B23Q:DETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TO....
- H04N:PICTORIAL COMMUNICATION, e.g. TELEVISION
- B25B:TOOLS OR BENCH DEVICES NOT OTHERWISE PROVIDED FOR,....
- G06T:IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G01N:INVESTIGATING OR ANALYSING MATERIALS BY DETERMININ....
- G01C:MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING....
- G01B:MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIME....
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