Testing system for anti-electromagnetic interference
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United States of America Patent
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Oct 6, 2015
Grant Date -
Oct 31, 2013
app pub date -
Apr 8, 2013
filing date -
Apr 26, 2012
priority date (Note) -
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Abstract
A testing system includes a signal emitter, a signal collection apparatus, and an analyzer. The signal emitter emits electromagnetic signals to cause electromagnetic interference in an electronic device. The signal collection apparatus collects the signals outputted by the target electronic device and includes a light emitter and an optical fiber. The analyzer is electronically connected to the signal collection apparatus. The light emitter emits light beams which reproduce the signals collected by the signal collection apparatus, and optical fiber transmits the light beams to the analyzer, the analyzer receives the light beams and reconstitutes the original electrical signals, and analyzes determines the electronic device performance while being subjected to the electromagnetic interference.
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