Device for detecting defective global word line
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United States of America Patent
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Oct 6, 2015
Grant Date -
N/A
app pub date -
Oct 28, 2014
filing date -
Jul 31, 2014
priority date (Note) -
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Abstract
A device for detecting defective memory includes a first global word line; a second global word line; a global word-line front end, connected to the first global word line; a global word-line driver, connected to the global word-line front end and driving the first global word line; a local word-line driver, connected to the first global word line and driving a local word line; and a voltage-controlled transistor, including a first terminal connected to the first global word line, a second terminal connected to a connection line between the global word-line front end and the global word-line driver, and a third terminal outputting a test current.
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