Teachable pattern scoring method

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United States of America Patent

PATENT NO 9152884
APP PUB NO 20130322741A1
SERIAL NO

13507115

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Abstract

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A computerized teachable pattern scoring method receives a teaching image and region pattern labels. A region segmentation is performed using the teaching image to generate regions of interest output. A feature measurement is performed using the teaching image and the regions of interest to generate region features output. A pattern score learning is performed using the region features and the region pattern labels to generate pattern score recipe output. A computerized region classification method using the region features and the pattern score recipe to generate pattern scores output. A region classification is performed using the pattern scores and region features to generate region class output.

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Patent Owner(s)

Patent OwnerAddress
LEICA MICROSYSTEMS CMS GMBHERNST-LEITZ-STRASSE 17-37 35578 WETZLAR WETZLAR

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Huang, Chi-Chou Redmond, US 15 78
Lee, Shih-Jong J Bellevue, US 87 2148

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