Circuit arrangement, a method for testing a supply voltage provided to a test circuit, and a method for repairing a voltage source
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United States of America Patent
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Sep 29, 2015
Grant Date -
Oct 16, 2014
app pub date -
Apr 15, 2013
filing date -
Apr 15, 2013
priority date (Note) -
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Abstract
A circuit arrangement may include: a memory, composed of a memory cell array, including a plurality of memory cells, and a peripheral circuitry; a voltage source configured to provide at least one supply voltage; a test circuit integrated with the memory cell array and the voltage source, wherein the test circuit receives the supply voltage; the test circuit including: at least one test memory cell; at least one failure detection circuit configured to detect a data retention failure in the at least one test memory cell.
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