Statistical point pattern matching technique

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United States of America Patent

PATENT NO 9147287
SERIAL NO

13844572

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Abstract

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A statistical point pattern matching technique is used to match corresponding points selected from two or more views of a roof of a building. The technique statistically selecting points from each of orthogonal and oblique aerial views of a roof. generating radial point patterns for each aerial view, calculating the origin of each point pattern, representing the shape of the point pattern as a radial function, and Fourier-transforming the radial function to produce a feature space plot. A feature profile correlation function can then be computed to relate the point match sets. From the correlation results, a vote occupancy table can be generated to help evaluate the variance of the point match sets, indicating, with high probability, which sets of points are most likely to match one another.

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Patent Owner(s)

Patent OwnerAddress
EAGLE VIEW TECHNOLOGIES INC3700 MONTE VILLA PARKWAY SUITE 200 BOTHELL WA 98021

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Ciarcia, Christopher Albert Monroe, US 6 337

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