Method for determining geometric imaging properties of a flat panel detector, correspondingly adapted X-ray inspection system and calibration phantom
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United States of America Patent
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Sep 29, 2015
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Jun 5, 2014
app pub date -
Nov 18, 2013
filing date -
Nov 30, 2012
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Abstract
A method and system for determining geometric imaging properties of a flat panel detector in an x-ray inspection system are described herein. The method can include arranging a calibration phantom between an x-ray source and the flat panel detector, the calibration phantom including at least one discrete geometric object. Additionally, the method can include recording at least one x-ray image of the calibration phantom with the flat panel detector. At least one discrete geometric shape is generated in the x-ray image by imaging the at least one discrete geometric object of the calibration phantom. Further, the method can include determining a location-dependent distortion error of the flat panel detector from the at least one x-ray image on the basis of at least one characteristic of the at least one discrete geometric shape. All characteristics of the at least one discrete geometric shape used for determining the location-dependent distortion error are independent of the dimensions of the calibration phantom.
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