Fabricating method of nano structure for antireflection and fabricating method of photo device integrated with antireflection nano structure

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United States of America Patent

PATENT NO 9123832
APP PUB NO 20130078750A1
SERIAL NO

13702172

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Abstract

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A method of fabricating nanostructure for antireflection and a method of fabricating a photo device integrated with the nanostructure for antireflection are provided. The fabrication of the nanostructure for antireflection includes coating a solution containing a combination of metal ions with organic or inorganic ions on a substrate, sintering the coated solution using an annealing process to grow nanoscale metal particles, and chemically etching the substrate using the metal particles as mask or accelerator to form a subwavelength nanostructure on the surface of the substrate, thereby manufacturing the nanostructure for antireflection without an apparatus requiring a vacuum state using a simple method for a short amount of time to minimize reflection of light at an interface between a semiconductor material and the air, and producing a photo device having good luminous efficiency and performance at low cost in large quantities by applying it to the photo device.

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Patent Owner(s)

Patent OwnerAddress
GWANGJU INSTITUTE OF SCIENCE AND TECHNOLOGY123 CHEOMDANGWAGI-RO BUK-GU GWANGJU 61005

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Lee, Yong Tak Gwangju, KR 20 117
Song, Young Min Gwangju, KR 13 52
Yeo, Chan Il Gwangju, KR 19 37

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