Single beam backscatter x-ray system
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United States of America Patent
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Sep 1, 2015
Grant Date -
Oct 31, 2013
app pub date -
Apr 30, 2012
filing date -
Apr 30, 2012
priority date (Note) -
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Abstract
A method and apparatus for inspecting an object is present. Radiation is emitted from a radiation source. A beam is formed from a portion of the radiation emitted by the radiation source using a collimator. The collimator is connected to the radiation source by a bearing system comprising a first structure associated with the radiation source and a second structure connected to the first structure. The second structure is configured to hold the collimator. The second structure of the bearing system is moved using a movement system such that the second structure rotates in one of a plurality of directions substantially about a center point in the radiation source while the radiation source remains stationary relative to the second structure. Rotation of the second structure substantially about the center point in the radiation source changes a direction in which the beam is directed.
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