Defect detection method, method for repairing organic EL element, and organic EL display panel
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United States of America Patent
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Sep 1, 2015
Grant Date -
Jun 5, 2014
app pub date -
Feb 22, 2013
filing date -
Jun 14, 2012
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Abstract
A defect detection method for an organic EL element having a first electrode, a second electrode, and a functional layer and a light-emission layer disposed between the electrodes, including: applying a first voltage, between the electrodes, that, when the organic EL element includes, between the electrodes, a defective portion that is a potential cause of non-light emission of the light-emission layer, reduces electrical resistance of a first portion, of the functional layer, corresponding to the defective portion and makes the organic EL element detectable as a dark spot, whose light-emission layer does not emit light; and after applying the first voltage, applying a second voltage between the electrodes and detecting whether or not the organic EL element is the dark spot, the second voltage, when the organic EL element does not include the defective portion, causing the light-emission layer to emit light.
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