Method of testing anti-high temperature performance of a magnetic head and apparatus thereof
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United States of America Patent
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Sep 1, 2015
Grant Date -
Nov 1, 2012
app pub date -
Apr 29, 2011
filing date -
Apr 29, 2011
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Abstract
A method of testing anti-high temperature performance of a magnetic head comprises applying a second magnetic field with different intensities in a second direction and the changing first magnetic fields in a first direction, and measuring a plurality of second output parameter curves; and judging whether a variation that is beyond an allowable value is presented on the second output parameter curves, thereby screening out a defective magnetic head, therein the first direction is perpendicular to the air bearing surface of the magnetic head, and the second direction is perpendicular to the shielding layers of the magnetic head. The present invention can screen out defective magnetic heads that possess poor anti-high temperature performance without heating the magnetic head and with high precision.
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