Method for characterizing integrated circuits for identification or security purposes
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United States of America Patent
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Sep 1, 2015
Grant Date -
Jul 19, 2012
app pub date -
Mar 30, 2012
filing date -
Nov 13, 2006
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Abstract
A method of detecting small changes to a complex integrated circuit measuring RF/microwave scattering parameters between every pin over a wide frequency range. The data from a characterization of a known good integrated circuit is stored and compared to each subsequent integrated circuit of unknown background.
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