Method and system for improving precision of element measurement based on laser-induced breakdown spectroscopy

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United States of America Patent

PATENT NO 9121756
APP PUB NO 20140036253A1
SERIAL NO

14000356

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Abstract

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The present invention provides a method and a system for improving the precision of element measurement based on laser-induced breakdown spectroscopy. The method comprises: press-forming a sample to be measured with a tablet press; making a cavity on or immediately above a surface of the press formed sample; forming a layer of aerosol immediately above the surface of the sample to be measured with the components thereof completely identical to those of the sample to be measured; testing the sample to be measured by using a laser-induced breakdown spectroscopic system, so as to obtain the intensities of the characteristic spectral lines of a target element in the sample to be measured; and determining the concentration of the target element in the sample to be measured according to a calibration curve of the target element in prearranged calibration samples.

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Patent Owner(s)

Patent OwnerAddress
TSINGHUA UNIVERSITY100084 TSINGHUA YUAN BEIJING HAIDIAN DISTRICT BEIJING CITY BEIJING CITY 100084

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Feng, Jie Beijing, CN 85 1143
Hou, Zongyu Beijing, CN 1 0
Li, Lizhi Beijing, CN 12 31
Li, Zheng Beijing, CN 308 1492
Wang, Zhe Beijing, CN 485 4696
Yuan, Tingbi Beijing, CN 1 0

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