Calibrating temperature coefficients for integrated circuits
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United States of America Patent
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Aug 18, 2015
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app pub date -
Nov 20, 2013
filing date -
Nov 20, 2013
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Abstract
A calibration system and method are disclosed that include a first bias current generator configured for generating a first bias current that is proportional to absolute temperature (PTAT) and a second bias current generator configured for generating a second bias current that is complementary to absolute temperature (CTAT). The first and second bias currents are copied, multiplied and then summed into a total output bias current, which can be used to bias an electronic circuit. A temperature coefficient is calibrated by changing a ratio of the first and second bias current contributions to the total output bias current, while maintaining the same total output bias current level for a given temperature.
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