Determining, calibrating, and exporting K-factors and bend allowance
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United States of America Patent
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Aug 18, 2015
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N/A
app pub date -
Mar 28, 2014
filing date -
Jul 16, 2009
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Abstract
The present disclosure is directed to systems and methods for determining and calibrating a K-factor for material and to methods and systems for calibrating forming devices, forming device controls, and/or forming device components. The disclosed systems and methods can dynamically provide exact and calibrated values for the parameters needed to produce correct and accurate flat patterns based on any type of material or any tooling combination. As such, the systems and methods of the present disclosure can be used to achieve a first run perfect or near-perfect part capability that does not currently exist.
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