Prompt gamma-ray detection apparatus for analyzing chemical materials using femtosecond pulse laser-induced neutrons
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United States of America Patent
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-
Aug 4, 2015
Grant Date -
Jul 19, 2012
app pub date -
Dec 14, 2011
filing date -
Dec 20, 2010
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
Disclosed herein is a prompt gamma-ray detection apparatus for analyzing chemical materials using femtosecond pulse laser-induced neutrons, which can be effectively used in the nondestructive inspection of various materials, such as metals, coal, cement, radioactive materials and the like as well as explosives and chemical materials, and which can provide better measurement results for the analysis of basic materials, and a method of measuring prompt gamma-rays using the apparatus. The prompt gamma-ray detection apparatus is advantageous because it can non-destructively analyze the elements in a chemical sample using a femtosecond pulse laser-induced neutron generator that solves the problems of an atomic reactor for research or a radioactive isotope as a neutron radiation source.
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International Classification(s)
- 2011 Application Filing Year
- G21G Class
- 72 Applications Filed
- 56 Patents Issued To-Date
- 77.78 % Issued To-Date
Cited Art Landscape
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- 0 Citation Count
- G21G Class
- 0 % this patent is cited more than
- 10 Age
Maintenance Fees
| Fee | Large entity fee | small entity fee | micro entity fee | due date |
|---|---|---|---|---|
| 11.5 Year Payment | $7400.00 | $3700.00 | $1850.00 | Feb 4, 2027 |
