Modular atomic force microscope with environmental controls

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United States of America Patent

PATENT NO 9097737
SERIAL NO

13998691

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Abstract

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A modular Atomic Force Microscope that allows ultra-high resolution imaging and measurements in a wide variety of environmental conditions is described. The instrument permits such imaging and measurements in environments ranging from ambient to liquid or gas or extremely high or extremely low temperatures.

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Patent Owner(s)

Patent OwnerAddress
OXFORD INSTRUMENTS ASYLUM RESEARCH INC6310 HOLLISTER AVENUE GOLETA CA 93117

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Cleveland, Jason Ventura, US 45 304
Hodgson, Jim Santa Barbara, US 3 5
Proksch, Roger Santa Barbara, US 57 377
Rutgers, Maarten Los Angeles, US 9 47
Viani, Mario Santa Barbara, US 10 51

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