Deflection indication gauge
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United States of America Patent
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Aug 4, 2015
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N/A
app pub date -
Feb 14, 2013
filing date -
Feb 14, 2013
priority date (Note) -
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Abstract
A method, and apparatus, for determining bend resistance of a sample includes applying a weight to a sample and measuring an amount of deflection of the sample caused by applying the weight. The sample is provided on a sample holder and an initial position of the sample is measured with respect to the sample holder. A weight is applied to the sample and a change in position from the initial position to a deflection position of the sample due to the weight applied to the sample is measured. An amount of deflection of the sample is determined by dividing the change in position by the basis weight.
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