Photomask blank and method for manufacturing photomask

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United States of America Patent

PATENT NO 9091931
APP PUB NO 20120251930A1
SERIAL NO

13494530

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Abstract

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According to one embodiment, a photomask blank wherein a second film is stacked on a first film, the first film containing chromium and which is not substantially etched by the dry etching using fluorine and which is etchable by the dry etching using oxygen-containing chlorine, and the second film containing no chromium and which is etchable by dry etching using fluorine and dry etching using oxygen-containing chlorine.

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Patent Owner(s)

Patent OwnerAddress
TOPPAN INCTOKYO

International Classification(s)

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Inazuki, Yukio Joetsu, JP 113 794
Koitabashi, Ryuji Joetsu, JP 20 260
Kojima, Yosuke Tokyo, JP 18 217
Yoshikawa, Hiroki Joetsu, JP 143 1539

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