Multi-functional online testing system for semiconductor light-emitting devices or modules and method thereof
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United States of America Patent
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Jul 28, 2015
Grant Date -
Jan 15, 2015
app pub date -
Oct 17, 2013
filing date -
Jul 15, 2013
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Abstract
The disclosure provides a system and method for multi-functional online testing of semiconductor light-emitting devices or modules. The system includes an electrical characteristic generating and testing equipment, one or more optical characteristic detecting and controlling equipments, an optical signal processing and analyzing equipment, one or more thermal characteristic detecting equipments, a central monitoring and processing computer, a multi-channel integrated drive controlling equipment, one or more multi-stress accelerated degradation controlling equipments, and one or more load boards. The present disclosure enables in-situ online monitoring and testing under accelerated degradation in a multi-stress accelerated degradation environment.
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