Resistance measurement system and method of using the same

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 9085464
APP PUB NO 20130236631A1
SERIAL NO

13414669

Stats

ATTORNEY / AGENT: (SPONSORED)

Importance

Loading Importance Indicators... loading....

Abstract

See full text

A quality control system for the manufacture of carbon nanostructure-laden substrates includes a resistance measurement module for continuously measuring resistance of the carbon nanostructure (CNS)-laden substrate.

Loading the Abstract Image... loading....

First Claim

See full text

Family

Loading Family data... loading....

Patent Owner(s)

Patent OwnerAddress
APPLIED NANOSTRUCTURED SOLUTIONS LLC2323 EASTERN BOULEVARD BALTIMORE MD 21220

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Fleischer, Corey A Timonium, US 16 72
Gaigler, Randy L Parkville, US 17 117
Liu, Han Lutherville-Timonium, US 104 584
Malecki, Harry C Abingdon, US 48 1508
Malet, Brandon K Baltimore, US 9 208
Markkula, Samuel J Rising Sun, US 5 80

Cited Art Landscape

Load Citation

Patent Citation Ranking

Forward Cite Landscape

Load Citation

Maintenance Fees

Fee Large entity fee small entity fee micro entity fee due date
11.5 Year Payment $7400.00 $3700.00 $1850.00 Jan 21, 2027
Fee Large entity fee small entity fee micro entity fee
Surcharge - 11.5 year - Late payment within 6 months $160.00 $80.00 $40.00
Surcharge after expiration - Late payment is unavoidable $700.00 $350.00 $175.00
Surcharge after expiration - Late payment is unintentional $1,640.00 $820.00 $410.00