Leveling apparatus and atomic force microscope including the same

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United States of America Patent

PATENT NO 9081272
APP PUB NO 20140304861A1
SERIAL NO

14243728

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Abstract

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The present invention relates to a leveling apparatus that levels an object to be leveled with a surface of a substrate by measuring the force applied to the object, and an atomic force microscope including the leveling apparatus.

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Patent Owner(s)

Patent OwnerAddress
PARK SYSTEMS CORPKANC 4TH FLOOR 109 GWANGGYO-RO YEONGTONG-GU SUWON-SI GYEONGGI-DO 16229

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Jo, Ah Jin Seoul, KR 3 2
Kim, Suk Hyun Seoul, KR 1 2
Noh, Han Aul Suwon-Si, KR 2 2

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