Test system for analyzing a circuit carrier
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United States of America Patent
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Jul 7, 2015
Grant Date -
Sep 16, 2010
app pub date -
Jan 9, 2007
filing date -
Feb 9, 2006
priority date (Note) -
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Abstract
A test system for analyzing a circuit carrier which has been populated with a radio-frequency structure comprises a network analyzer having a signal generator for generating excitation signal which can be supplied to the radio-frequency structure via a signal line, an evaluation device for analyzing a measurement signal which returns from the radio-frequency structure, and a contact device which can be connected to the signal line and is intended to feed the excitation signal into the radio-frequency structure and to output the measurement signal. The contact device preferably has a measuring tip which is intended to hold test needles and can be used to make contact with a test point which is arranged on the circuit carrier and can be connected to the radio-frequency structure for signaling purposes.
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