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• 15 United States
• 10 France
• 8 Japan
• 7 China
• 5 Korea
• 2 Other

Patent Owner(s)

Patent Owner	Address
EMPIRE TECHNOLOGY DEVELOPMENT LLC	2711 CENTERVILLE ROAD SUITE 400 WILMINGTON DE 19808
GLITTER TECHNOLOGY LLP	152 BEACH ROAD #37-06 GATEWAY EAST SINGAPORE 189721

International Classification(s)

• H02J:CIRCUIT ARRANGEMENTS OR SYSTEMS FOR SUPPLYING OR D....
• H01M:PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT....

• [Classification Symbol]

• [Patents Count]

Inventor(s)

Inventor Name	Address	# of filed Patents	Total Citations
Iwamoto, Takashi	Urayasu, JP	181	2921

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Maintenance Fees

Fee	Large entity fee	small entity fee	micro entity fee	due date
11.5 Year Payment	$7400.00	$3700.00	$1850.00	Dec 30, 2026

Fee	Large entity fee	small entity fee	micro entity fee
Surcharge - 11.5 year - Late payment within 6 months	$160.00	$80.00	$40.00
Surcharge after expiration - Late payment is unavoidable	$700.00	$350.00	$175.00
Surcharge after expiration - Late payment is unintentional	$1,640.00	$820.00	$410.00

DATE PUBLISHED	PUBLICATION/PATENT NO.	PUBLICATION TYPE
June 30, 2015	US,9071066,B2   US9071066B2	GRANTED PATENT AS SECOND PUBLICATION
June 23, 2011	US,20110153224,A1   US20110153224A1	FIRST PUBLISHED PATENT APPLICATION

Full Text

US Patent No: 9071066

Measurement of environmental impact of electronic devices

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