SWIR targeted agile raman system for detection of unknown materials using dual polarization
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United States of America Patent
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Jun 9, 2015
Grant Date -
Apr 17, 2014
app pub date -
Mar 15, 2013
filing date -
Oct 15, 2012
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Abstract
The present disclosure provides for a system and method for analyzing a sample comprising at least one unknown material. A first location may be scanned to generate a SWIR hyperspectral image. The SWIR hyperspectral image may be generated using dual polarization techniques. The SWIR hyperspectral image may be analyzed to target a second location comprising the unknown material. This second location may be further analyzed using Raman spectroscopic techniques and a Raman data set may be generated. The Raman data set may be further analyzed to associate the unknown material with a know material.
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