Testing method using guided wave
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United States of America Patent
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May 26, 2015
Grant Date -
Nov 15, 2012
app pub date -
Feb 12, 2010
filing date -
Jan 21, 2010
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Abstract
A testing method using a guided wave generates a guided wave to propagate through a subject as a testing target in a longitudinal direction of the subject, detects a reflected wave of the guided wave and examines the subject on the basis of the reflected wave. The testing method includes the steps of (A) obtaining data for defect amount estimation beforehand indicating a relationship between a defect amount of the subject and a magnitude of a reflected wave, (B) generating a guided wave so as to propagate through the subject, and detecting a reflected wave of the guided wave, and (C) estimating a defect amount of the subject on the basis of the data for defect amount estimation obtained at (A) and the magnitude of the guided wave detected at (B).
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