X-ray beam system offering 1D and 2D beams
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United States of America Patent
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May 12, 2015
Grant Date -
Dec 12, 2013
app pub date -
Jun 7, 2013
filing date -
Jun 8, 2012
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Abstract
A system for analyzing a sample is provided. The system includes an optical system capable of providing a one-dimensional beam and a two-dimensional beam. The system may include a beam selection device to select between providing a one-dimensional x-ray beam to the sample in a one-dimensional operation mode and a two-dimensional x-ray beam to the sample in a two-dimensional operation mode.
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