Micrometer
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United States of America Patent
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May 12, 2015
Grant Date -
Oct 24, 2013
app pub date -
Mar 15, 2013
filing date -
Apr 23, 2012
priority date (Note) -
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status (Latency Note)
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Abstract
A micrometer includes: a frame; an anvil; a spindle; an encoder; a display; a strain gauge that detects a deformation of the frame; a storage that stores a change amount of the detection value (a displacement of the spindle detected by the encoder) per a unit deformation detected by the strain gauge, as a compensation factor; and a compensator that compensates the detection value based on a difference between a zeroset-time deformation that is detected by the strain gauge when a command for zeroset is given and a measurement-time deformation that is detected by the strain gauge in measurement, and based on the compensation factor stored in the storage.
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