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• 15 United States
• 10 France
• 8 Japan
• 7 China
• 5 Korea
• 2 Other

Patent Owner(s)

Patent Owner	Address
SENSOR TEK CO LTD	6F NO 34-1 JIOUCYUAN ST DATONG DIST TAIPEI CITY

International Classification(s)

• H01L:SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICE....

• 2014 Application Filing Year
• H01L Class
• 23828 Applications Filed
• 21803 Patents Issued To-Date
• 91.51 % Issued To-Date

Inventor(s)

Inventor Name	Address	# of filed Patents	Total Citations
Chou, Wen-Chieh	Taoyuan County, TW	11	21
# of filed Patents : 11 Total Citations : 21
Liu, Mao-Chen	Nantou County, TW	11	10
# of filed Patents : 11 Total Citations : 10
Lu, Po-Wei	Bade, TW	14	15
# of filed Patents : 14 Total Citations : 15
Wang, Chun-Chieh	Taichung, TW	247	1218
# of filed Patents : 247 Total Citations : 1218
Weng, Shu-Yi	Miaoli County, TW	8	5
# of filed Patents : 8 Total Citations : 5

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Patent Citation Ranking

• 0 Citation Count
• H01L Class

• 0 % this patent is cited more than
• 10 Age

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Maintenance Fees

Fee	Large entity fee	small entity fee	micro entity fee	due date
11.5 Year Payment	$7400.00	$3700.00	$1850.00	Oct 28, 2026

Fee	Large entity fee	small entity fee	micro entity fee
Surcharge - 11.5 year - Late payment within 6 months	$160.00	$80.00	$40.00
Surcharge after expiration - Late payment is unavoidable	$700.00	$350.00	$175.00
Surcharge after expiration - Late payment is unintentional	$1,640.00	$820.00	$410.00

DATE PUBLISHED	PUBLICATION/PATENT NO.	PUBLICATION TYPE
April 28, 2015	US,9018771,B2   US9018771B2	GRANTED PATENT AS SECOND PUBLICATION
September 11, 2014	US,20140252362,A1   US20140252362A1	FIRST PUBLISHED PATENT APPLICATION

Full Text

US Patent No: 7339660

Illumination device for product examination

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Abstract

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An illumination device for use with a product inspection machine inspecting products according to at least one characteristic. The invention also pertains to an illumination device for use in sorting machines that optically sort or separate nonstandard fungible objects from standard objects as they pass a viewing station by viewing such objects illuminated by at least one wavelength. The invention includes a plurality of arrays of semiconductor light sources impinging on passing product and at least one array of semiconductor light sources of wavelength and intensity equal to the plurality of arrays impinging on a background surface for detection and comparison.

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Description

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Claims

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Claims data not available

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Legal Events

 

• MAFP2019
• FPAY2015
• FPAY2011
• CC2008
• I2008
• STCF2008
• F2006
• PD2006
• AS2006

Date	Code	Event	Description
Aug 22, 2019	MAFP	MAINTENANCE FEE PAYMENT	free format text: PAYMENT OF MAINTENANCE FEE, 12TH YEAR, LARGE ENTITY (ORIGINAL EVENT CODE: M1553); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY year of fee payment: 12
Aug 19, 2015	FPAY	FEE PAYMENT	year of fee payment: 8
Aug 03, 2011	FPAY	FEE PAYMENT	year of fee payment: 4
Jun 03, 2008	CC	CERTIFICATE OF CORRECTION
Mar 04, 2008	I	Issuance
Feb 13, 2008	STCF	INFORMATION ON STATUS: PATENT GRANT	free format text: PATENTED CASE
Nov 29, 2006	F	Filing
Nov 29, 2006	PD	Priority Date
Jun 27, 2006	AS	ASSIGNMENT	free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:COHN, AVI P.;MACK, LARRY H., JR.;REEL/FRAME:018562/0550 Owner name: SATAKE USA, INC., TEXAS Effective Date: Jun 27, 2006