Bonding apparatus and bonding method
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United States of America Patent
Stats
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Apr 28, 2015
Grant Date -
Oct 4, 2012
app pub date -
Jul 15, 2011
filing date -
Mar 28, 2011
priority date (Note) -
In Force
status (Latency Note)
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Abstract
The bonding apparatus is capable of effectively increasing temperature of a substrate and reducing occurrence of position gaps and poor connection in a process of flip-chip-bonding semiconductor devices to the substrate. The bonding apparatus comprises: a supporting unit for supporting the substrate, on which the semiconductor devices have been adhered by a non-conductive; and a heating/pressing unit for heating and pressing the substrate, the heating/pressing unit having a built-in heat source and a clamping face, onto which the substrate supported by the supporting unit is pressed. The substrate supported by the supporting unit is moved toward the clamping face of the heating/pressing unit so as to preheat the substrate and the semiconductor devices by radiation heat. Then, the semiconductor devices are pressed onto the clamping face of the heating/pressing unit so as to cure the non-conductive adhesive and bond bumps of the semiconductor devices to terminal sections of the substrate.

First Claim
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- 15 United States
- 10 France
- 8 Japan
- 7 China
- 5 Korea
- 2 Other
Patent Owner(s)
Patent Owner | Address | |
---|---|---|
APIC YAMADA CORPORATION | 90 OOAZA KAMITOKUMA CHIKUMA-SHI NAGANO 3890898 ?3890898 |
International Classification(s)

- [Classification Symbol]
- [Patents Count]
Inventor(s)
Inventor Name | Address | # of filed Patents | Total Citations |
---|---|---|---|
Kobayashi, Kazuhiko | Chikuma, JP | 222 | 3624 |
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11.5 Year Payment | $7400.00 | $3700.00 | $1850.00 | Oct 28, 2026 |
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Surcharge after expiration - Late payment is unavoidable | $700.00 | $350.00 | $175.00 |
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