Touch probe and related checking method
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United States of America Patent
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Apr 28, 2015
Grant Date -
Aug 15, 2013
app pub date -
Oct 25, 2011
filing date -
Oct 29, 2010
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Abstract
A touch probe (1; 1′; 1″; 1′″) for applications in machine tools or measuring machines includes a support frame (2) with a protective casing (3), and a movable armset (5) with a feeler (11) to touch a part to be checked (13). The probe includes a detection device (23) with a laminar piezoelectric transducer (25) made of polymeric material, such as polyvinylidene fluoride, which is connected to the support frame and fixed at a bearing and locating area (7), on which the movable armset rests in a position defined by an isostatic rest system (17). Conditioning electronics (30) connected to the support frame include processing means for processing a force signal (M) provided by the detection device, comparing it with a threshold value (S) and generating a touch signal (T). The conditioning electronics include differential charge amplifiers (3) and a processing system (55) to dynamically vary the threshold value depending on the most recent values of the force signal detected.
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