Method for manufacturing probe card

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United States of America Patent

PATENT NO 9015935
APP PUB NO 20120042509A1
SERIAL NO

13182254

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A method for manufacturing a probe card includes inserting an attaching portion of each probe into one of first through holes provided on a probe substrate at least in a row, inserting a probe tip portion of each probe into second through holes respectively provided on a plurality of plate-like positioning members piled in their thickness directions at least in a row, relatively displacing the adjacent positioning members in opposite directions to two-dimensionally position the probe tip portions of the probes, and thereafter softening a conductive jointing material to position the attaching portions of the respective probes against the first through holes.

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Patent Owner(s)

Patent OwnerAddress
KABUSHIKI KAISHA NIHON MICRONICSMUSASHINO-SHI TOKYO 180-8508

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Takeya, Toshinaga Aomori, JP 6 21

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