Dual mode small angle scattering camera

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United States of America Patent

PATENT NO 9014335
APP PUB NO 20130329858A1
SERIAL NO

13912338

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Abstract

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A system for analyzing a sample is provided. The system includes a beam selection device for selecting between a one-dimensional operation mode for providing a one-dimensional x-ray beam to the sample and a two-dimensional operation mode for providing a two-dimensional x-ray beam to the sample.

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Patent Owner(s)

Patent OwnerAddress
RIGAKU INNOVATIVE TECHNOLOGIES INC1900 TAYLOR ROAD AUBURN HILLS MI 48326

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Jiang, Licai Rochester Hills, US 31 558

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