Capacitive analysis of a moving test material
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Apr 21, 2015
Grant Date -
Dec 26, 2013
app pub date -
Dec 14, 2011
filing date -
Mar 11, 2011
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
The capacitive measuring circuit for a moved elongated test material contains at least two measuring capacitors, each of which is configured for receiving the test material. It further contains electrically actuatable selection means, by means of which one of the measuring capacitors can be selected in such a way that only the selected measuring capacitor contributes to the measurement, whereas the other measuring capacitors do not. As a result, the total capacitance of the measuring circuit is reduced and its sensitivity is increased.
First Claim
Family
International Classification(s)
- G01L:MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL ....
- G01N:INVESTIGATING OR ANALYSING MATERIALS BY DETERMININ....
- G01C:MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING....
- G01R:MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC V....
- G01B:MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIME....
- G01D:MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VAR....
- G06K:RECOGNITION OF DATA; PRESENTATION OF DATA; RECORD ....
- [Classification Symbol]
- [Patents Count]
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully