Scanning terahertz probe
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United States of America Patent
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Apr 14, 2015
Grant Date -
Feb 3, 2011
app pub date -
Aug 28, 2008
filing date -
Aug 28, 2007
priority date (Note) -
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Abstract
A THz radiation probe (1) for examining an object (8), the probe comprising a first portion configured to be inserted into an opening of said object in a first direction (5), said probe further comprising at least one THz emitter (15), directing means (7) for directing THz radiation emitted from said emitter to said object via an aperture (2) located at said first portion and subsequently from said object to at least one THz detector (17) and, means for scanning said emitted THz radiation across said object in a scan direction, said scan direction having a component in said first direction (5).
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