Method and apparatus of tuning a scanning probe microscope
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United States of America Patent
Stats
-
Mar 31, 2015
Grant Date -
May 16, 2013
app pub date -
Nov 12, 2012
filing date -
Nov 11, 2011
priority date (Note) -
In Force
status (Latency Note)
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Abstract
An apparatus and method of automatically determining an operating frequency of a scanning probe microscope such as an atomic force microscope (AFM) is shown. The operating frequency is not selected based on a peak of the amplitude response of the probe when swept over a range of frequencies; rather, the operating frequency is selected using only peak data corresponding to a TIDPS curve.
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International Classification(s)
- 2012 Application Filing Year
- B82Y Class
- 2307 Applications Filed
- 1243 Patents Issued To-Date
- 53.88 % Issued To-Date
Cited Art Landscape
Patent Citation Ranking
- 4 Citation Count
- B82Y Class
- 0 % this patent is cited more than
- 10 Age
Maintenance Fees
| Fee | Large entity fee | small entity fee | micro entity fee | due date |
|---|---|---|---|---|
| 11.5 Year Payment | $7400.00 | $3700.00 | $1850.00 | Sep 30, 2026 |
