Test contact arrangement

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United States of America Patent

PATENT NO 8988094
APP PUB NO 20110089963A1
SERIAL NO

12933764

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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The invention relates to a test contact arrangement (15) for testing semiconductor components, comprising at least one test contact (10) which is arranged in a test contact frame (13) and is designed in the type of a cantilever arm and which has a fastening base (12) and a contact arm (30) which is provided with a contact tip (11) and which is connected to the fastening base, wherein the fastening base is inserted with a fastening projection (16) thereof into a frame opening (14) of the test contact frame in such a manner that a lower edge (17) of the fastening projection is essentially aligned flush with a lower side (18) of the test contact frame.

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Patent Owner(s)

Patent OwnerAddress
PAC TECH - PACKAGING TECHNOLOGIES GMBHAM SCHLANGENHORST 15-17 NAUEN D-14641

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Azdasht, Ghassem Berlin, DE 59 605

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