Photomask blank, process for production of photomask, and chromium-containing material film

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United States of America Patent

PATENT NO 8968972
APP PUB NO 20130230796A1
SERIAL NO

13883850

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Abstract

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In the chromium-containing material film of the present invention, an element is added thereto and is capable of bringing a mixture of the element and the chromium into a liquid phase at a temperature of 400° C. or lower. The use of such a chromium-containing material film as an optical film (e.g., a light-shielding film, an etching mask film, or an etching stopper film) of a photo mask blank can achieve an improvement in chlorine-dry etching while retaining the same optical characteristics and the like as those of the conventional chromium-containing material film, thereby increasing the patterning precision.

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Patent Owner(s)

Patent OwnerAddress
SHIN-ETSU CHEMICAL CO LTDTOKYO JAPAN TOKYO METROPOLIS

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Fukaya, Souichi Niigata, JP 21 73
Inazuki, Yukio Niigata, JP 113 794
Nakagawa, Hideo Niigata, JP 115 1603
Yamamoto, Tsuneo Niigata, JP 20 224
Yoshikawa, Hiroki Niigata, JP 143 1539

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