Method and apparatus for determining the surface topography of coated reflective surfaces

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United States of America Patent

PATENT NO 8964188
SERIAL NO

13524210

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Abstract

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The invention relates to the field of measurement technology and concerns a method and an apparatus, such as may be used, by way of example, in thin-layer technology for organic dielectric semi-conducting or conducting layers on substrates.

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Patent Owner(s)

Patent OwnerAddress
FLEXENABLE LIMITED34 CAMBRIDGE SCIENCE PARK MILTON ROAD CAMBRIDGE CAMBRIDGESHIRE CB40FX

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Calvimontes, Alfredo Dresden, DE 4 5
Lederer, Kay Dresden, DE 10 16

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