Atomic force microscope probe, method for preparing same, and uses thereof
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United States of America Patent
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Feb 17, 2015
Grant Date -
Oct 17, 2013
app pub date -
Dec 20, 2011
filing date -
Dec 22, 2010
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Abstract
An atomic force microscope probe comprising a piezo-electric resonator provided with two electrodes and coated with an insulating layer and a tip attached on the coated resonator and functionalized with at least one group or molecule of interest is disclosed. The disclosed technology also relates to preparation method and to different uses thereof.
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