Method and apparatus for detecting surface unevenness of object under inspection
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Feb 3, 2015
Grant Date -
Aug 4, 2011
app pub date -
Aug 25, 2009
filing date -
Aug 26, 2008
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
Minute surface unevenness formed on the surface of an object under inspection is detected, thereby improving the accuracy of an appearance inspection. A target surface in the sidewall region (21) of a tire (20) is illuminated by a red slit light from a first illuminating means (11) disposed in the direction of 45 degrees with respect to the normal line to the target surface. At the same time, the target surface is illuminated by a blue slit light from a second illuminating means (12) disposed in the direction of −45 degrees with respect to the normal line. The illuminated surface is shot by a line camera (13) from the direction of the normal line. An R-component image and a B-component image are produced from the original image, and their respective luminance distribution waveforms are obtained. The surface unevenness formed on the target surface is detected on the basis of the luminance distribution waveforms.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully