Dual scanning stage

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United States of America Patent

PATENT NO 8924014
SERIAL NO

13618545

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Importance

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Abstract

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A system having a beam for providing movement of a first stage and a second stage in a Y axis. The first stage receives a first substrate. A first motor provides movement for the first stage in an X axis. The second stage receives a second substrate. A second motor provides movement for the second stage in the X axis. The first stage and the second stage move together in the Y axis and independently in the X axis. A robot loads substrates onto the first stage and the second stage. A controller directs the robot to load a second substrate onto the second stage while simultaneously directing the first stage and the guide beam to scan a first substrate.

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Patent Owner(s)

Patent OwnerAddress
KLA-TENCOR TECHNOLOGIES INCMILPITAS CA

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Balan, Aviv Mountain View, US 11 55

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