Deformable polymer testing device

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United States of America Patent

PATENT NO 8906696
SERIAL NO

13593319

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Abstract

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A testing device uses a selectively deformable substrate to capture and retain spherical beads for genetic experimentation. A method of fabricating the device is described in which a silicon substrate can be coated with a photosensitive, bio-compatible polymer for photolithographic patterning using a single mask exposure. The polymer is patterned with a matrix of wells, each well capable of expansion to accept placement of a bead in the well, and contraction to secure the bead in the well. The polymer can exhibit piezoelectric properties that cause it to respond mechanically to a selected electrical excitation.

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Patent Owner(s)

Patent OwnerAddress
STMICROELECTRONICS ASIA PACIFIC PTE LTD (SINGAPORE)5A SERANGOON NORTH AVENUE SINGAPORE 554574

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Giridhar, Archit Singapore, SG 5 33

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